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KTa0.5Nb0.5O3 ferroelectric thin films: processing, characterization and application to microwave agile devices

机译：KTa0.5Nb0.5O3铁电薄膜：微波捷变器件的加工，表征和应用

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Resarch Program of Regional Interest DISCOTEC - BRETAGNE Collaboration(s)

机译：DISCOTEC-BRETAGNE区域利益研究计划）

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Laur, Vincent; Moussavou, Arnaud-Gides; Rousseau, Anthony; Laurent, Paul; Tanné, Gérard; Bouquet, Valérie; Guilloux-Viry, Maryline; Huret, Fabrice;
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年度 2008
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专利

1. KTa_(0.5)Nb_(0.5)O_3 ferroelectric thin films: processing, characterization and application to microwave agile devices [J] . V. Laur, A. Moussavou, A. Rousseau, Frequenz . 2007,第9a10期

机译：KTa_（0.5）Nb_（0.5）O_3铁电薄膜：微波捷变器件的加工，表征和应用
2. FERROELECTRIC THIN FILMS-BASED TECHNOLOGY FOR FREQUENCY- AND PHASE- AGILE MICROWAVE COMMUNICATION APPLICATIONS [J] . FELIX A. MIRANDA, FRED W. VAN KEULS, ROBERT R. ROMANOFSKY Integrated Ferroelectrics . 2002,第1期

机译：基于铁电薄膜的频率和相位捷变微波通信应用技术
3. KTa_(0.5)Nb_(0.5)O_3 ferroelectric thin films grown by pulsed laser deposition: structural characteristics and applications to microwave devices [J] . A.-G. Moussavou, S. Deputier, A. Perrin, Physica status solidi . 2008,第10期

机译：通过脉冲激光沉积生长的KTa_（0.5）Nb_（0.5）O_3铁电薄膜：结构特征及其在微波器件中的应用
4. Wide-Band Characterization of Ferroelectric Thin-Films: Applications to KTN-based Microwave Agile Devices [C] . Vincent LAUR, Anthony ROUSSEAU, Gerard TANNE, European Microwave Conference; 20060910-15; Manchester(GB) . 2006

机译：铁电薄膜的宽带表征：在基于KTN的微波捷变器件中的应用
5. Design and characterization of frequency agile RF and microwave devices using ferroelectrics. [D] . Nath, Jayesh. 2006

机译：使用铁电体的频率捷变射频和微波设备的设计和表征。
6. Ultrathin Ferroelectric Films: Growth Characterization Physics and Applications [O] . Ying Wang, Weijin Chen, Biao Wang, 2014

机译：超薄铁电薄膜：生长表征物理和应用
7. KTa0.5Nb0.5O3 ferroelectric thin films: processing, characterization and application to microwave agile devices [O] . Laur, Vincent, Moussavou, Arnaud-Gides, Rousseau, Anthony, 2008

机译：KTa0.5Nb0.5O3铁电薄膜：微波捷变器件的加工，表征和应用
8. Correlation Between Material Properties of Ferroelectric Thin Films and Design Parameters for Microwave Device Applications: Modeling Examples and Experimental Verification [R] . Miranda, Felix A., VanKeuls, Fred W., Subramanyam, Guru, 2000

机译：铁电薄膜材料特性与微波器件应用设计参数的相关性：建模实例和实验验证

KTa0.5Nb0.5O3 ferroelectric thin films: processing, characterization and application to microwave agile devices

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